Christelle Guillermier holds a Ph.D. in Physics from the University Claude Bernard Lyon, specializing in charged particle-matter interaction. She previously served as Director of the Center for NanoImaging at Brigham and Women's Hospital, where she led the deployment of the NanoSIMS 50 and expanded its use in biomedical research. With over two decades of experience in Secondary Ion Mass Spectrometry (SIMS), including early work with NP-SIMS, she has contributed to both instrument development and applications spanning materials science, geochemistry, and biology. Her work focuses on extending the limits of SIMS technologies, developing methodologies to extract molecular and spatial information at the nanoscale. At Bienne Technology, she brings this expertise to a broader goal: making nanoscale analysis accessible across scientific disciplines and industry.