Stanislav V. Verkhoturov received his Ph.D in physics, with a speciality in physical electronics, from Arifov Institute of Electronics, Uzbekistan, in 1994.

 

He is a Senior Research Scientist in the Department of Chemistry and the Materials Characterization Facility, Texas A&M University. His research interests include development of new methods and devices for nanoscale surface analysis. He is the author of over 100 papers published in peer-reviewed journals.