Next Generation Mass Spectrometry Solutions
Massive hypervelocity projectiles produce high secondary ion multiplicity, enabling event-by-event bombardment-detection. Click here to explore our cutting-edge solutions and revolutionize your ion mass spectrometry experience.
Cross-Industry Innovation
Bienne's cross‑industry innovation potential is extraordinary because its core capability—precise molecular identification—translates seamlessly across scientific, industrial, and consumer domains.
Materials Science & Manufacturing - Surface chemistry optimization, additive manufacturing QA, and nanomaterial design.
Biotechnology & Healthcare - Real‑time biomarker profiling, therapeutic monitoring, and ex‑vivo cell analysis.
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Frequently Asked Questions
Common questions we receive...
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Nanoscale lateral resolution: Existing techniques cannot identify the molecular makeup with 10-15nm lateral resolution. Ref[1]
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Defect detection and homogeneity assessment: By gathering molecular profiles from nano-spots, the tool can detect rare defects, assess sample homogeneity and reveal molecular environments in unprecedented dimensions. Ref[2]
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Next-Generation device design: By offering at previously unavailable scales, the instrument allows developers to evaluate new materials and improve the design and reliability of next-generation devices. Ref[3]
Ref[1] Anal. Chem. 2022, 94, 7868
Ref[2] Mater. Metrol. 2019, 18(2), 023504; ibid. 2022, 21(4), 044001-1; Proc. SPIE 2022, 12055, 1205505-1
Ref[3] ACS Appl. Eng. Mater. 2023, 1(10), 2817.
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Unmatched detection sensitivity: NP-SIMS can differentiate complex molecular assemblies within 10-15nm with detection sensitivity that is at least one order of magnitude superior to other instruments [ref1].
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Ultra-high lateral resolution : The most advanced traditional SIMS instruments can produce elemental maps with ~ 30nm and molecular ones with ~ 100nm lateral resolutions respectively. NP-SIMS samples discrete volumes measuring 10-15nm across [ref1].
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Measuring nanometric homogeneity: Instead of delivering an average reading over a large area, NP-SIMS records the data from a few million individual nano-impacts. The data from each impact show if different molecules are co-mingled or segregated [ref2].
Ref[1]: Anal. Chem. 2018, 90, 12692.
Ref[2]: J. Micro/Nanolith. MEMS, MOEMS, 2019, 18, 033502.
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Sub-10-nm molecular detection: NP-SIMS can achieve lateral resolution below 10nm by appropriate size selection of the NP. Ref[1]
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Nanosize topography: surface structures affect the spatial distribution of ionized ejecta (e.g. shadow effects).
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Rare defect isolation: The NP-SIMS methodology detects rare defects and anomalies that deviate from the surface mean by just 3 standard deviations. Ref[2]
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Molecular environment assessment: NP-SIMS reveals the composition of the chemical nano environment.Ref[3]
Ref[1]: Rapid Comm. Nass Spectrom. 2026, 40, 10162
Ref[2]: J. Micro/Nanopattern,, Mater. Metrol. 2022, 21(4), 044002
Ref[3]: Proc. SPIE, 11325, Metrology, Inspection, Process Contr. Microlithography XXXIV, 2020, 113252R
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